Microscope images could be obtained much more quickly -- rather than one pixel at a time -- thanks to a new imaging method for neutral atomic beam microscopes. It could ultimately lead to engineers and scientists getting faster results when they are scanning samples.
source https://www.sciencedaily.com/releases/2024/08/240816121515.htm
Electrons in twisted graphene form novel 1/3 fractional quantum Hall state
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A research team discovered a quantum state in which electrons move in a
completely new way under a twisted graphene structure. The unique
electronic state ...
5 hours ago
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